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Home > Events > Invited Talks > 2014 > Simulation-Guided Analysis for Industrial Embedded Control Designs

Jim Kapinski

Tuesday, July 15, 2014

11:00am Meeting room 302 (Mountain View), level 3

Jim Kapinski, Senior Research Engineer, Toyota Technical Center, Los Angeles, USA

Simulation-Guided Analysis for Industrial Embedded Control Designs

Abstract:

Model-based development (MBD) is a popular technique for performing embedded control system design for cyber-physical systems, such as automotive control systems. MBD designs are used to generate critical software, so it is vital to ensure correctness of these designs, but verifying MBD designs is a difficult and expensive process. This talk presents some current research into simulation-guided approaches to evaluate whether MBD designs meet functional and performance requirements. We present a technique to perform Lyapunov analysis and to discover contraction metrics for nonlinear dynamical systems using information obtained from simulations of the system. We demonstrate how the technique can be applied to industrial systems with an automotive powertrain control example.